R. Obula Konda Reddy

Work place: JNTUA College of Engineering, India

E-mail: rkondareddy@gmail.com

Website:

Research Interests:

Biography

Ramireddy Obulakonda Reddy received Bachelor’s degree in Computer Science and Engineering from Sri Krishnadevaraya University and Master's of Technology degree in Computer Science and Engineering and Pursuing Ph.D, at JNTUA, Anantapur . He is having 08 years of experience in teaching and research and taught for bachelor and master degree courses. His area of interest includes Pattern Recognition, Image Analysis, cloud computing, Network Systems, Software Architecture. He attended many conferences and workshops and communicated papers to reputed National and International journals.

Author Articles
Classifying Similarity and Defect Fabric Textures based on GLCM and Binary Pattern Schemes

By R. Obula Konda Reddy B. Eswara Reddy E. Keshava Reddy

DOI: https://doi.org/10.5815/ijieeb.2013.05.04, Pub. Date: 8 Nov. 2013

Textures are one of the basic features in visual searching,computational vision and also a general property of any surface having ambiguity. This paper presents a texture classification system which has high tolerance against illumination variation. A Gray Level Co-occurrence Matrix (GLCM) and binary pattern based automated similarity identification and defect detection model is presented. Different features are calculated from both GLCM and binary patterns (LBP, LLBP, and SLBP). Then a new rotation-invariant, scale invariant steerable decomposition filter is applied to filter the four orientation sub bands of the image. The experimental results are evaluated and a comparative analysis has been performed for the four different feature types. Finally the texture is classified by different classifiers (PNN, K-NN and SVM) and the classification performance of each classifier is compared. The experimental results have shown that the proposed method produces more accuracy and better classification accuracy over other methods.

[...] Read more.
Other Articles