International Journal of Information Engineering and Electronic Business (IJIEEB)
IJIEEB Vol. 5, No. 5, 8 Nov. 2013
Cover page and Table of Contents: PDF (size: 714KB)
Classifying Similarity and Defect Fabric Textures based on GLCM and Binary Pattern Schemes
Full Text (PDF, 714KB), PP.25-33
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Author(s)
R. Obula Konda Reddy
1,*
B. Eswara Reddy
2
E. Keshava Reddy
3
Index Terms
Feature extraction, K-NN, LBP, LLBP, SLBP, Steerable filter decomposition, SVM and PNN
Abstract
Textures are one of the basic features in visual searching,computational vision and also a general property of any surface having ambiguity. This paper presents a texture classification system which has high tolerance against illumination variation. A Gray Level Co-occurrence Matrix (GLCM) and binary pattern based automated similarity identification and defect detection model is presented. Different features are calculated from both GLCM and binary patterns (LBP, LLBP, and SLBP). Then a new rotation-invariant, scale invariant steerable decomposition filter is applied to filter the four orientation sub bands of the image. The experimental results are evaluated and a comparative analysis has been performed for the four different feature types. Finally the texture is classified by different classifiers (PNN, K-NN and SVM) and the classification performance of each classifier is compared. The experimental results have shown that the proposed method produces more accuracy and better classification accuracy over other methods.
Cite This Paper
R. Obula Konda Reddy, B. Eswara Reddy, E. Keshava Reddy, "Classifying Similarity and Defect Fabric Textures based on GLCM and Binary Pattern Schemes", International Journal of Information Engineering and Electronic Business(IJIEEB), vol.5, no.5, pp.25-33, 2013. DOI:10.5815/ijieeb.2013.05.04
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