Ashwini Patil

Work place: Department of Information Technology, Rajarambapu Institute of Technology, Shivaji University, Sakharale, MS-415414, India

E-mail: ashwini.patil@ritindia.edu

Website:

Research Interests: Machine Learning

Biography

Prof. Ashwini B. Patil is M. Tech. in Computer Science and Technology. Currently, she is working as Assistant Professor in the Department of Information Technology at Rajarambapu Institute of Technology, Rajaramnagar, Sakharale, MS, India. She has 20 years of academic experience. She is having life membership of ISTE. Her area of interest is Networking, Machine Learning, and Programming. She has published total 32 research papers in National / International Journal and Conferences. She has also published book entitled “Commence Web Development with PHP and MySQL”, ISBN Number: 978-93-81476-13-0, Aruta Publishers, in academic year 2014-15.

Author Articles
Product Defect Detection Using Deep Learning

By Venkatesh Khemlapure Ashwini Patil Nikita Chavan Nisha Mali

DOI: https://doi.org/10.5815/ijisa.2024.04.03, Pub. Date: 8 Aug. 2024

To maximize production efficiency, product quality control is paying more attention to the quick and reliable automated quality visual inspection. Product defect detection is a critical part of the inspection process. Manual defect detection has a lot of flaws that can be overcome using a deep learning approach. In this paper we have proposed and implemented the deep learning models to detect defects in the manufactured product. Two types of classification, i.e., binary and multiclass classification, is done using CNN, AlexNet, and YOLO algorithms. For the binary classification which is just used to check whether there is a defect in the product, we have proposed three different architectures of CNN, out of which the third CNN model gave 99.44% and 97.49% for training and testing, respectively. We also tested the AlexNet model and got accuracy of 97.6%. And for the multiclass classification that is used for identification of type(s) of defects, the YOLOv8 model is proposed and implemented, which gives better results by attaining a remarkable accuracy of 98.7% for multiclass classification. We also designed and developed the Android Application, which is used on the field for defect detection in the manufacturing industry.

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