Work place: Tianjin Key Lab of Intelligent Computing & Novel Software Technology, Key Laboratory of Computer Vision and System, Ministry of Education, Tianjin, China
E-mail:
Website:
Research Interests: Computational Engineering, Engineering
Biography
Kai Shi was born in Anhui province, China, 1970. He received bachelor degree in communication engineering from PLA University of Science and Technology, Nanjing, China, 1992. He is now an army engineer in 31121 PLA troops, Nanjing, China. His current research interests include microwave and millimeter-wave (mm-wave) theories and technologies, RF/microwave components and systems.
By Liu He Xing-Jian Zhong De-Xin Qu Zhen-Dong Fan Kai Shi
DOI: https://doi.org/10.5815/ijwmt.2018.05.04, Pub. Date: 8 Sep. 2018
In this paper, a simple method based on coupling control theory to suppress multiple harmonics in open-loop bandpass filters is proposed. Coupled feeding is utilizing in this paper, and by choosing proper coupling length and position of the input/output port, multiple harmonics could be suppressed. The input impedance of microstrip line with its end open-circuited is firstly showed and the theory on harmonics suppression is then analyzed to choose a proper coupling position. A second-order open-loop bandpass filter is designed and manufactured, measured and manufactured results both have a stopband to 5f0 with rejection more than 20dB. On the base of the filter proposed, the stopband can be broaden to 10f0 by adding two stubs. It well validates the proposed solution.
[...] Read more.By Jinsong Wang Wenchao Dou Kai Shi
DOI: https://doi.org/10.5815/ijwmt.2011.03.04, Pub. Date: 15 Jun. 2011
In order to found a scalable platform for attack resistance test, this paper proposed a simulation method for network attack. We designed a modular framework and using XML to describe the test cases. We also realized both stateful and stateless attacks by Socket programming and Jpcap packet forging method. Experiment results showed that the system has good scalability and provides a template-based testing circuit.
[...] Read more.Subscribe to receive issue release notifications and newsletters from MECS Press journals