IJISA Vol. 7, No. 7, 7 Jun. 2015
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Mixed-Signal Circuit, Sensitivity Analysis, Monte-Carlo Analysis, Artificial Neural Network, Virtual Instrument
This paper presents parametric fault diagnosis in mixed-signal analog circuit using artificial neural networks. Single parametric faults are considered in this study. A benchmark R2R digital to analog converter circuit has been used as an example circuit for experimental validations. The input test pattern required for testing are reduced to optimum value using sensitivity analysis of the circuit under test. The effect of component tolerances has also been taken care of by performing the Monte-Carlo analysis. In this study parametric fault models are defined for the R2R network of the digital to analog converter. The input test patterns are applied to the circuit under test and the output responses are measured for each fault model covering all the Monte-Carlo runs. The classification of the parametric faults is done using artificial neural networks. The fault diagnosis system is developed in LabVIEW environment in the form of a virtual instrument. The artificial neural network is designed using MATLAB and finally embedded in the virtual instrument. The fault diagnosis is validated with simulated data and with the actual data acquired from the circuit hardware.
Ashwani Kumar Narula, Amar Partap Singh, "Fault Diagnosis of Mixed-Signal Analog Circuit using Artificial Neural Networks", International Journal of Intelligent Systems and Applications(IJISA), vol.7, no.7, pp.11-17, 2015. DOI:10.5815/ijisa.2015.07.02
[1]Liu, E. Kao, W., Felt, E. “Analog testability analysis and fault diagnosis using behavioral modeling” Custom Integrated Circuits Conference, pp. 413-416. 1994.
[2]Charles Stroud, Jason Morton, Atia Islam and Hazem Alassaly, “A Mixed-Signal Built-In Self-Test Approach for Analog Circuits” Southwest Symposium on Mixed-Signal Design, pp. 196-201, 2003.
[3]P.Kalpana, K.Gunavathi, “Fault oriented Test Pattern Generator for Digital to Analog converters” Academic Open Internet Journal, Volume 13, 2004.
[4]Ramesh, J. Srinivasulu, M.; Gunavathi, K. “A novel on chip circuit for fault detection in digital to analog converters” International Conference on Control, Automation, Communication and Energy Conservation, pp. 1-8, 2009.
[5]P. Kalpana, K. Gunavathi, “A Novel Implicit Parametric Fault Detection Method for Analog/Mixed Signal Circuits Using Wavelets” ICGST-PDCS Journal, Volume 7, Issue 1, pp. 43-48, May, 2007.
[6]Peng Wang, Shiyuan Yang, “ A New Diagnosis Approach for Handling Tolerence in Analog and Mixed-Signal Circuits by Using Fuzzy Math” IEEE Transactions on Circuits and Systems-I: Regular Papers, Vol. 52, No.10, pp. 2118-2127, 2005.
[7]William G. Fenton, T. M. McGinnity, and Liam P.Maguire, Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review, IEEE Transactions on Systems, Man, and Cybernetics—part c: Applications and Reviews 31, No.3 pp. 269-281. 2001.
[8]Haipeng Pan, Bo Chen, “Intelligent Fault Diagnosis Based on ANN: A Review” The 2nd International Conference on Computer Application and System Modeling, pp. 115-118, 2012.
[9]B. Kaminaska, K. Arabi, I. Bell, p. Goteti, J.L Huertas, B. Kim, A. Rueda, M.Soma, “Analog and Mixed-signal Benchmark Circuits- First Release” International Test Conference, pp. 183-190, 1997.
[10]Mihai Iordache, Lucia Dumitriu, Dragos Niculae, “On The Sensitivity Analysis Of Analog Circuits”, Annals of the University of Craiova, Electrical Engineering series, No. 32, pp. 11-16, 2008.
[11]S. Bhuvaneswari, J. Sabarathinam, “Defect Analysis Using Artificial Neural Network” I.J. Intelligent Systems and Applications, 05, pp. 33-38, 2013.
[12]Milad Malekzadeh, Alireza Khosravi, Abolfazl Ranjbar Noei, Reza Ghaderi,“Application of Adaptive Neural Network Observer in Chaotic Systems” I.J. Intelligent Systems and Applications, 02, pp. 37-43, 2014.
[13]Jafferey Travis, Jim Kring, LabVIEW for Everyone: Graphical Programming Made Easy and Fun, Pearson Education, 2009.
[14]Jayabalan Ramesh, Ponnusamy Thangapandian Vanathi, Kandasamy Gunavathi, “Fault Classification in Phase-Locked Loops Using Back Propagation Neural Networks”. ETRI Journal, 30, pp.557-554, 2008.
[15]Jagtar Singh, Amar Partap Singh, “Estimation of Feed Position of a Rectangular Microstrip Antenna Using ANN”, IE(I) Journal-Electronics and Telecommunication, pp. 20-25, 2010.