International Journal of Education and Management Engineering (IJEME)
IJEME Vol. 2, No. 8, 29 Aug. 2012
Cover page and Table of Contents: PDF (size: 361KB)
Customized Online Test Database Systems and Automatic Generation System for Testing Papers
Full Text (PDF, 361KB), PP.45-52
Views: 0 Downloads: 0
Author(s)
Zhi Liu
1,*
Ronghua Liang
1
Xiang Pan
1
Index Terms
Test database system, automatic generation system for testing paper, online, improved genetic algorithm
Abstract
In the online test database system, a major issue is how to input the questions with formulas and pictures to the test database, while maintaining the format of test questions in order to support the printing layout. In this paper, a test database system supporting the formulas and pictures stored is designed and implemented. Based on this database system, an automatic generation system for test paper is achieved based on improved genetic algorithm. The J2EE technology is used to develop the online system. The system has friendly interface and it is easy to be operated. This system can support multidisciplinary test database and it can be customized according to different chapters and sections. The experiments show it is a useful online test database system and automatic generation system for testing papers.
Cite This Paper
Zhi Liu,Ronghua Liang,Xiang Pan,"Customized Online Test Database Systems and Automatic Generation System for Testing Papers", IJEME, vol.2, no.8, pp.45-52, 2012. DOI: 10.5815/ijeme.2012.08.08
Reference
[1] Wang You-ren, Zhang Zhai, Gui Jiang, Yao Rui, and Chu Jian-bo. Mathematical Model and Algorithm of Intelligent Test Paper Auto-generation System from Item Pool[J], System Engineering Theory and Practic, 2004(9), P85-89(In Chinese).
[2] Yang Jun, Application of Improved Genetic Algorithm in Automatic Test Paper Generation[J], Computer Applications and Software, 2009(12), Vol. 26, P225-227.(In Chinese).
[3] Yang Luming, Chen Daxin, Application of an Improved Genetic Algorithm in Composing a Test Paper[J], Computer and Digital Engineering, 2004(5), Vol. 32, P76-79. (In Chinese).