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International Journal of Mathematical Sciences and Computing(IJMSC)

ISSN: 2310-9025 (Print), ISSN: 2310-9033 (Online)

Published By: MECS Press

IJMSC Vol.2, No.3, Jul. 2016

Analysis of Some Software Reliability Growth Models with Learning Effects

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Author(s)

Javaid Iqbal

Index Terms

Software Reliability;Software Reliability Growth Model (SRGM);Non-Homogeneous Poisson Process (NHPP);Learning effect;two-type learning effect

Abstract

A newly developed software system before its deployment is subjected to vigorous testing so as to minimize the probability of occurrence of failure very soon. Software solutions for safety critical and mission-critical application areas need a much focused level of testing. The testing process is basically carried out to build confidence in the software for its use in real world applications. Thus, reliability of systems is always a matter of concern for us. As we keep on performing the error detection and correction process on our software, the reliability of the system grows. In order to model this growth in the system reliability, many formulations in Software Reliability Growth Models (SRGMs) have been proposed including some based on Non-Homogeneous Poisson Process (NHPP). The role of human learning and experiential pattern gains are being studied and incorporated in such models. The realistic assumptions about human learning behavior and experiential gains of new skill-sets for better detection and correction of faults on software are being incorporated and studied in such models. In this paper, a detailed analysis of some select SRGMs with learning effects is presented based on use of seven data sets. The estimation of parameters and comparative analysis based on goodness of fit using seven data sets are presented. Moreover, model comparisons on the basis of total defects predicted by the select models are also tabulated.

Cite This Paper

Javaid Iqbal,"Analysis of Some Software Reliability Growth Models with Learning Effects", International Journal of Mathematical Sciences and Computing(IJMSC), Vol.2, No.3, pp.58-70, 2016.DOI: 10.5815/ijmsc.2016.03.06

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